Finland – Laboratoriuminstrumenten, optische en precisie-instrumenten (uitgezonderd brillen) – Electrochemical atomic force microscopy device

Electrochemical atomic force microscopy device:

1. non-resonant sinusoidal-oscillating imaging mode (nroIM): a. Pure vertical z-modulation of the cantilever; amplitudes (from < 1 nm to > 250 nm) and frequencies (from 125 Hz up to 2 kHz) freely selectable. b. In each contacting cycle, a direct determination of the maximum contact force (force setpoint) takes place in real time, where upon all control parameters are automatically and continuously optimized. Force setpoint minimum down to 10 pN. Stable imaging also for "negative force setpoints", i.e., below the baseline of the free force curve. c. Effective line rate >= 2 Hz at 512 pixel/line for all force setpoints possible. d. Suited for cantilevers with spring constants from < 0.001 N/m to > 500 N/m. e. Topography, DMT modulus, adhesion, energy dissipation, force setpoint error and deformation are measured and displayed simultaneously (location and time) and in real time. f. Lateral resolution down to atomic defects in lattice is possible. g. The tip-sample force interaction is continuously displayed in real time during the imaging process. h. This mode can be operated without any limitation of functionality with liquid cells, heating cells, EC cell, etc. The change of deflection signal due to cantilever drift is automatically and continuously eliminated (drift, e.g., induced by change of temperature or other environmental conditions).
2. System should be temperature controlled to minimize thermal drift: sensor in scanner and bridge with feedback loop to have scanner + bridge at similar temperature. Availability to heat from ambient to 35 deg. C.
3. System must be: a. Low-z-noise (< / = 40 pm RMS) atomic force microscope (AFM) with closed-loop tip-scanner (in all 3 axes) >= 85 um x 85 um x 9.5 um XYZ. b. Large sample space, capable to integrate heavy (> 5 kg) additional components (e.g., Nanoprober, customized sample holders, external magnetic fields). c. Motorized 150 mm x 150 mm sample stage. d. Extensive set of resonant, non-resonant and non-resonant oscillating imaging modes. The non-resonant, sinusoidal-oscillating imaging mode (nroIM) with freely selectable i) pure vertical z-modulation of the cantilever (amplitudes from < 1 nm to > 250 nm) and ii) frequencies from 125 Hz up to 2 kHz, WITH automated, continuous contact force dependent imaging gains optimization. e. Enhanced scan parameter optimization algorithms that continuously monitor and automatically optimize key feedback-loop parameters (gains, setpoint) for all 3 imaging modes (contact, resonant and non-resonant oscillating). Algorithms are also based on a trace-retrace correlation score. User sets scan size, scan rate and pixel density, then selects engage and system sets and automatically controls feedback settings during scanning continuously. f. Extensive set of piezo force microscopy (PFM) imaging and spectroscopy modes volume spectroscopy (hyperspectral mapping modes) of PFM signals (frequency sweep on large bandwidth to get contact resonance frequency and eigenmode (amplitude/phase versus voltage) simultaneously to topography and mechanical properties, further referred to as dataCUBE modes. g. Torsional resonance mode to acquire dynamic friction signal. Mode has proven to high-resolution image moire pattern of stacked 2D materials. h. Nano-electrical imaging of surface potential (KPFM) in non-resonant, sinusoidal-oscillating imaging mode.
4. Sample handling and automation: a.

Accessible sample space >/= 150 mm x 150 mm x 18 mm XYZ, up to 45 mm height. b. Motorized (minimum 150 mm x 150 mm) and programable sample stage, with vacuum sample hold down. c. Vertical, software controlled and automated AFM-tip engage functionality.